Transmission Electron Microscopy
Although EES-1 does not have TEM facilities, per se, it does have access to LANL facilities that are unquestionably state-of-the-art. The facilities include a Philips CM-30 dedicated for analytical TEM (EDS), a JEOL 3000F (a 300 keV FEG TEM equipped with EDS and PEELS), and a VG dedicated STEM (with FEG source and PEELS/EDS capabilities). In addition, EES-1 has sample preparation facilities for TEM, including a Gatan ion mill and access to a Reichert-Jung microtome. Other facilities available at LANL for sample preparation include mechanical thinning devices and a precision ion mill.
George Guthrie is the primary EES-1 user of the TEM facilities, so contact him for more information (505-665-6340 or gguthrie@lanl.gov).